Wafer Fabrication Data
High Temperature Operating Life (HTOL), Failures in Time (FIT), Mean Time to Fail (MTTF).
Assembly/Package Process Data
Autoclave (PCT), Highly Accelerated Stress Test (HAST), High Temperature Storage (HTS), Temperature Cycling Test (TCT), Temperature Humidity Bias (THB), Thermal Shock Test (TST), Unbiased HAST.
Reliability Data Pack
Reliability process data for legacy Linear products. Individual product reliability data for legacy Linear products can be found on the product pages.